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Double Dispersion August 2019 |
Unique ability to design and optimize layers in which n,k vary with both thickness and wavelength. |
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CEC Support January 2018 |
Support for Cutting Edge Coatings deposition systems. |
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XL Functions August 2017 |
BASIC XL functions for reading and writing user-specified Excel files (XLS, XLSX). Excel not required. |
|
DESIGN
Projects December 2016 |
New facility for easily organizing optical coating projects, typically by customer. |
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DESIGN
Collector October 2016 |
Upgraded Spectra Collector adds Calculate button. Saves multiple-angle spectra in XLS format. |
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Pike Autosampler
Support May 2016 |
Code showing how to integrate Pike Autosampler (rotating stage) into MEASURE automation procedures. |
|
Cary UMA
Support February 2016 |
Advanced support for Agilent Cary Universal Measurement Accessory. Spectra Collector module also implemented in DESIGN. |
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Circle Diagrams May 2015 |
Interactor admittance and reflectance amplitude vs. thickness. |
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Contour Plot Upgrade December 2014 |
Major update to 2D contour plot (%R/%T vs. wavelength and angle). |
|
Plot,
Report Upgrade December 2014 |
FSPlot (SQPlot) Customizer and Report Generator Organizer make it easier to save and recall plot and report formats. |
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Ellipsometry Upgrade June 2014 |
New Interactor ellipsometric plotting capabilities vs. thickness, wavelength, etc. |
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MEASURE Test Mode April 2014 |
MEASURE now runs in Test Mode with a DESIGN USB key. This provides means to develop macros, etc. |
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8453 LAN Support December 2013 |
MEASURE (Scantraq) now supports HP/Agilent 8453 via LAN communications. |
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Monitor Calibration August 2013 |
MONITOR wavelength calibration upgraded. Includes improved facility for replacing the monochromator grating for IR utilization. |
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IC6 Support July 2013 |
CRYSTAL updated to transfer IC6 materials and layers. Free software acquires and plots deposition data. LAN support added. |
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MEASURE Trial Mode July 2013 |
MEASURE (Scantraq) adds Trial Mode for prospective users who need to test instrument communications prior to paying. |
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Monitor Bandwidth June 2012 |
Include monochromator bandwidth compensation in DESIGN (R/T vs t) and MONITOR. |
|
Updated FSPlot Module May 2012 |
Coating technicians who manually mark up coating curves will find it far more convenient than previously. |
| Report Generator
64-bit April 2012 |
A new print engine fixes problems experienced by users when printing to local and network printers under Windows 7. |
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Stack Mode March 2012 |
Stack Mode is intended for designs composed of many materials. Each layer has its own dispersion values, table or index function. |
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MEASURE T^2
Mode Oct 2011 |
MEASURE (Scantraq) adds a transmission squared mode intended for variable angle transmission accessories. |
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User-Defined Functions Oct 2011 |
DESIGN User-Defined Functions/Targets have been upgraded and integrated with a new Calculator. |
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Scan Macros Oct 2011 |
Scan macros are BASIC programs attached to the scan button. Macros can be run before and after Baseline, Reference and Sample scans. Macros can be utilized for user prompts or automation. |
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MONITOR Run-Time May 2011 |
Quickly estimate total coating run-time. Includes pumping time, rise time, cooling time. |
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MEASURE Spectra Backup Feb 2011 |
Ever forget to save a measured curve and then had to re-scan? The Spectra Backup Recorder auto-saves up to 9999 spectra. |
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Diabatic Transmittance Oct 2010 |
The Schott diabatic transmittance scale [1-log(log1/t)] conveniently displays passbands and blocking regions on the same graph. |
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Design Recorder Oct 2010 |
Ever lose a superior design while trying a new starting design or changing optimization variables? Turn on the Recorder! |
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Intellemetrics Support Sep 2009 |
FilmStar MONITOR adds support for Intellemetrics optical monitors. |
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StellarNet Spectrometers Aug 2009 |
New FTG StellarNet Server supports StellarNet spectrometers for FilmStar DESIGN and MEASURE/Scantraq users. |
|
PE
Spectrum 100 Oct 2008 |
New FilmStar MEASURE (Scantraq) Spectrum server Sp100.exe supports the new PerkinElmer Spectrum 100 FTIR, including the Optica model configured for optics users (replaces GX). |
|
Global Search Sep 2008 |
Global Search provides a method to determine new starting designs. Groups (layers within parentheses) and the FilmStar Workbook are supported. |
|
PE Lambda 1050 Sep 2008 |
New FilmStar MEASURE (Scantraq) version Mpe1050 supports the Triple Detector Module (InGaAs for improved near-IR performance) and Universal Reflectance Attachment. |
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Auxiliary Serial Communications Feb 2008 |
MEASURE (Scantraq) now supports serial communications with external devices. This provides means for users to integrate xy-stages, programmable logic controllers, etc. |
| Interactor
Updates Oct, Dec 2007 |
In October the Interactor added the important ability to vary material indices. The December update made it much easier to select layers in designs with many layers. |
|
Layer Error Analyzer Mar 2007 |
This important facility lets users view layer errors determined by inverse-synthesis. It then generates FilmStar BASIC code to compensate for these errors. |
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Updated
FSPlot Module Mar 2007 |
FSPlot Module now uses GDI+. The benefits are superior monochrome printing and smoother (anti-alias) plot curves. |
|
DESIGN
File Browser Mar 2007 |
A new File Properties browser makes it easy for larger facilities to manage designs. Users can select My Designs, etc. |
| Lambda 19
XP Support Sep 2006 |
A new version of MEASURE (Scantraq) supports PE Lambda 18-19 under Win 2000/XP. The required Lambda AX PCI board and cable assembly is available from FTG Software. |
|
DESIGN
Interactor May 2006 |
FilmStar DESIGN 2.50 adds a secondary main screen which lets users interactively adjust designs and instantly plot results. |
|
PE URA Support Apr 2006 |
A new version of MEASURE (Scantraq) supports PE 650-950 with URA (Universal Reflectance Accessory) |
|
Hitachi
Support Jan 2006 |
A new version of MEASURE (Scantraq) supports Hitachi U-3210 and U-3410 (aka U-3200, 3400) |
| ODX
Support Jun 2005 |
Import/export of ODX (Optical Design eXchange) XML design files and materials files (*.odx) |
| SYRUSpro
Support Jun 2005 |
Support in FilmStar DESIGN, INDEX and MONITOR for Leybold SYRUSpro includes creation of XML file and automatic entry of Leybold defined dispersive index functions. As part of this effort, FilmStar BASIC was added to MONITOR. |
|
Mixed
Materials Apr 2005 |
Index formulas can now be a function of up to three dispersive tables. |
|
FilmStar Database Apr 2005 |
New FilmStar Database technology based on FileMaker Pro replaces the previous Access-based module. |
|
PE Spectrum One Feb 2005 |
A new ActiveX server enables MEASURE (Scantraq) to control the PerkinElmer Spectrum One FTIR spectrometer. |
| Code
Generators Feb 2005 |
BASIC code creators for FSPlot annotations and the Report Generator ease the task of reproducing plots and reports. |
| Cary
Accessories Jul 2004 |
In MEASURE (Scantraq) for Cary, FilmStar BASIC adds several functions (CaryAccy...) for controlling accessories. |
| New
Materials Models Apr 2004 |
Forouhi-Bloomer and Tauc-Lorentz dispersion models added to DESIGN and INDEX. |
| Upgraded
DLS Feb 2004 |
The DLS (damped least squares) optimizer has been improved by implementing a new matrix inversion algorithm. |
|
User-Defined Targets Oct 2003 |
User-defined functions of reflectance, transmittance and phase can be utilized as optimization targets. |
| IC/5 DAQ Package Jul 2003 |
IC/5 Data Logger and IC/5 Data Plotter allow users to acquire and display Rate, Power and Thickness vs. time. This diagnostic tool is available to MONITOR and CRYSTAL users. |
| FilmStar Administrator Jun 2003 |
A
FilmStar Administrator bit can be added to HASP Security
ID Modules. The Administrator can then set numerous security options on
users' computers.
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